Build the best-suited station for your needs, whether you're testing individual chips for R&D or full production wafers. The adaptive OPAL family of test stations from EXFO can handle any scenario, from individual chips to full production wafers.

The OPAL Platform

Available in multi-die and single-die configurations, EXFO’s OPAL stations share many elements including probe heads, vision systems, and most importantly, the PILOT software. This allows for flexible migration from single-die testing to wafer characterisation. OPAL platforms come with advanced automation software that provides high-performance functionalities to control motion, vision systems, and test instrumentation from EXFO or third parties. The software also offers advanced features for data analysis and AI modeling, transforming measurements of photonic integrated circuits into informed decisions and actions.

Benefits

• EXFO provides users with insight and knowledge for data-driven decision-making. This is achieved through powerful automated test stations, a software suite, and a structured database. These tools gather high-quality data from measuring photonic integrated circuits.
• The control software is flexible, allowing for system interoperability. Clients can create and customise their own control and test systems as needed.
• The advanced automation software enables users to define and maintain a logical structure among circuit components, design parameters, simulation results, experimental results and conditions, computation results, and sequences. This ensures traceability, reliability, and creates a report and AI-ready dataset.

Build Your Station Configuration

The OPAL platform is a modular solution with up to 4 heads setup simultaneously in any combination. Optical or electrical probes can be positioned around the device under test in any orientation: North, East, South, and West. This flexibility enables customers to tailor and scale testing to their needs for optimal results.