EXFO CTP10 Passive Optical Component Testing Platform

Key Features

• Swept wavelength measurements of insertion loss (IL), polarization dependent loss (PDL) or return loss (RL)
Industry-first full-band PDL measurement from 1260 to 1620 nm
• >70 dB dynamic range with ±5 pm accuracy and 1 pm resolution in a single sweep at 100 nm/s
• Powerful embedded graphical user interface with advanced built-in analysis functions
• Full automation via SCPI commands
• Scalable architecture for R&D and manufacturing environments
• Integrated cable stowing system

Applications

• PIC wafer-level testing
• Multiple-output passive optical component testing in manufacturing and R&D
• WSS and ROADM calibration and tests
• Thin film filters (TFF) characterisation

Description 

The CTP10 is a modular passive optical component testing platform that combines speed, accuracy and flexibility. It offers reliable, high-quality insertion loss (IL), return loss (RL) or polarization dependent loss (PDL) measurement regardless of wavelength range or spectral characteristics of the device under test. It operates together with EXFO’s T100S-HP series of swept tunable laser to perform these measurements within seconds.

Thanks to its modular configuration, it is the ideal instrument to characterize large port count components used in WDM networks and photonic integrated circuits (PIC).

Next-gen platform and modules

Thanks to its innovative approach, the CTP10 also greatly reduces setup time and simplifies spectral characterization by taking care of many complex operations. Indeed, tunable laser sweep, data collection and processing for IL, RL or PDL, trace display and analysis are all performed from a single instrument.

The CTP10 platform is compatible with a choice of key modules for spectral characterization (IL PDL & IL PDL OPM2 modules or IL RL OPM2), wavelength control modules (SCAN SYNC and FBC module) and detection modules (OPMx module). These fully integrated modules are hot-swappable to greatly reduce setup time and provide a flexible and evolutive test solution.

The CTP10 has an embedded operating system for handling and processing large amounts of data. It also offers a scalable architecture by sharing one or several tunable lasers among up to 8 test stations and by adding a secondary mainframe for 100+ ports testing.

Unparalleled performance

The CTP10 offers uncompromising performance and maintains best-in-class specifications at full speed over the full wavelength range of operation with an integrated setup. This combination of speed, accuracy, integration and spectral coverage is unprecedented on the market and ideal as a future-proof testing solution on next generation components such as wavelength selective switches (WSS) or ring-resonators.

The range-free series of OPMx optical detectors can measure a dynamic range of >70 dB in a single sweep at 100 nm/s, with a 1-pm resolution, drastically increasing throughput in manufacturing and R&D. The OPMx detectors can also accurately measure extremely sharp spectral features of up to 10 dB/pm (10,000 dB/nm).

Powerful intuitive GUI

The CTP10 has been developed around three key principles: integration, performance and automation. Its embedded software offers a powerful and intuitive GUI that seamlessly controls the measurement process to let you focus on what really matters: measurement data and analysis. Additionally, the CTP10 offers full remote control via SCPI‑compatible commands.