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Fast and accurate characterisation of fiber optic components, integrated optical devices, and short-run optical networks.
OFDR (optical frequency domain reflectometry) serves a similar purpose as OTDR (Optical Time Domain Reflectometry) and yet these two technologies function very differently. An interrogator using OTDR transmits a lightpulse of known width and measures the reflected energy and it’s time of flight to determine the magnitude and location of an event along the length of a fiber network.
A known disadvantage of OTDR’s is the presence of a deadzone in which the interrogator is momentarily blind to measuring reflected energy. This deadzone manifests itself in a relatively high spatial resolution. Spatial resolution is the ability to detect closely spaced events along the length of a fiber network. Deadzones are typically in the order of meters and this makes OTDR unsuitable for applications where low spatial resolution or high accuracy is required.
By contrast, OFDR scans a fiber network using light from a variable frequency swept wavelength coherent laser coupled into an interferometer. One leg of the interferometer is a reference path of fixed length while the other leg represents the optical network under test. Backscattered light from fiber under test is combined with light from the reference arm and the intersection of these creates an interference signal. This interference signal contains information pertaining to the precise location and magnitude of reflective events along the length of the network under test.
In order to extract this information a series of Fourier transforms are performed on the interference signal, the output of which is a display indicating the precise location and magnitude of reflective events along the length of fiber network. OFDR is able to measure the precise location of reflective events with no deadzone. Using OFDR, cable lengths and fault locations can be measured precisely and optical networks and components can be characterized.
High-speed communications ranging from long haul to data center is driving a revolution in optical component design and making Silicon Photonics a reality. Optical characterization of PICs present some unique challenges, and Luna has developed tools uniquely suited to address those challenges.
To learn more about how Luna’s OVA 5000 saves time by fully characterizing an optical component in a single 3 second scan, click here
To learn more about how Luna’s OBR 4600 can help you see inside a photonic integrated circuit, click here
Higher internet data speeds drive higher performance requirements that in turn drive more stringent specifications for components, cables and connectors. Luna’s reflectometers and network analyzers give manufacturers the tools they need to build product according to specs the first time, and every time.
Fiber optics are increasingly becoming the communications backbone of choice for aircraft and other high performance industrial equipment. Luna’s reflectometers, with their ability to pinpoint faults with micron resolution, are just what maintenance technicians need when asset downtime is not an option.
To learn more about how Luna’s OBR’s can help locate faults in fiber optic networks quickly, and with precision, click here
Luna’s Optical Vector Analyzer (OVA) is the only instrument on the market that is capable of full and complete all-parameter linear characterization of single-mode optical components in a single scan.
The OVA simultaneously performs these optical component characterizations every 3 seconds:
The OVA provides comprehensive component characterization of dispersion compensation modules, AWGs, Fiber Bragg Gratings and many other optical devices. A complete vector measurement of the linear transfer function is used to characterize the device under test.
Luna’s Optical Backscatter Reflectometer (OBR) delivers unprecedented inspection and diagnostic capabilities for the fiber optics industry. Luna’s state-of-the-art OBR provides isolation of faults and problems well before final test, saving hours in rework and hard dollars in yield loss.
Industry-leading 10 micron spatial resolution with zero dead-zone will pinpoint even the smallest contributors to loss: bends, crimps, bad splices, you name it — we find it. The distributed sensing option provides even a more complete picture of what’s happening in the system. Discover what you don’t know about your component and what Luna’s OBR can do for you.
Designed for component testing, short run network testing and troubleshooting, the OBR 4600 enables ultra high resolution reflectometry with backscatter level sensitivity. The OBR 4600 has spatial resolution as fine as 10 microns and no deadzone. Extensive range of options including a strain and temperature sensing package with maximum sensor lengths up to 2 kilometers.
The Luna OBR 5T-50 is a fast, simple-to-use, low cost precision reflectometer that measures the Insertion Loss (IL) and Return Loss (RL) distribution of passive optical components and modules including PLCs, optical cables, connectors, switches, couplers and more. This instrument utilises swept-wavelength interferometry to measure backscattered light as a function of distance with -125 dB sensitivity and 20 micron spatial resolution. The OBR 5T-50 reduces cost and complexity, while increasing throughput by measuring RL, IL and length with a single measurement.
Luna’s Optical Backscatter Reflectometer™ (OBR) 4200 is the industry’s only portable, ultra-high resolution reflectometer with backscatter-level sensitivity designed to test short networks. In a small, rugged, easily transportable platform, the OBR 4200 provides the capability to “see” any event in a fiber assembly or network out to 500 meters with no dead-zone and millimeter resolution. With industry-leading sensitivity and resolution in a portable platform, the OBR 4200 is the ultimate tool for manufacturing and on-site inspection and troubleshooting of your fiber optic network.
Luna’s PHOENIX™ swept tunable lasers are designed for low noise and highly linear swept performance appropriate for a variety of fiber optic test, measurement and sensing applications.
Application software gives the user simple but effective control of the laser. It also provides for monitoring of wavelength, power and two user accessible optical receivers.
MEMs-based, external cavity laser, based on the former Iolon ‘Apollo’ class of tunable lasers, offering low noise and precise tuning capability over the C-band.
The compact PHOENIX 1200 tunable laser and driver package features picometer accuracy and the industry’s first integrated wavemeter.
The benchtop PHOENIX 1400 tunable laser and driver package features the best wavelength precision and resolution available.